Electron spectroscopy of rare-gas clusters irradiated by x-ray free-electron laser pulses from SACLA

Research output: Contribution to journalArticle

Abstract

We have measured electron energy spectra and asymmetry parameters of Ar clusters and Xe clusters illuminated by intense x-rays at 5 and 5.5 keV. A velocity map imaging spectrometer was developed for this purpose and employed at an x-ray free-electron laser facility, SACLA in Japan. The cluster size dependence and the peak fluence dependence of the electron spectra and asymmetry parameters are discussed.

Details

Authors
  • H. Fukuzawa
  • T. Tachibana
  • K. Motomura
  • W. Q. Xu
  • K. Nagaya
  • S. Wada
  • M. Siano
  • S. Mondal
  • Y. Ito
  • M. Kimura
  • T. Sakai
  • K. Matsunami
  • H. Hayashita
  • J. Kajikawa
  • X-J Liu
  • E. Robert
  • C. Miron
  • R. Feifel
  • J. P. Marangos
  • K. Tono
  • Y. Inubushi
  • M. Yabashi
  • M. Yao
  • K. Ueda
Organisations
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Atom and Molecular Physics and Optics

Keywords

  • rare-gas cluster, nanoplasma, XFEL
Original languageEnglish
Article number034004
JournalJournal of Physics B: Atomic, Molecular and Optical Physics
Volume49
Issue number3
Publication statusPublished - 2016
Publication categoryResearch
Peer-reviewedYes