Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system

Research output: Contribution to journalArticle

Abstract

The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence |μ| has been quantified as a function of the secondary source aperture (SSA); the coherence is larger than 50% for SSA sizes below 11 µm at hard X-ray energies of 14 keV. For an SSA size of 5 µm, the degree of coherence has been determined to be 87%.

Details

Authors
Organisations
External organisations
  • University of Göttingen
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Accelerator Physics and Instrumentation
  • Materials Chemistry

Keywords

  • coherence, holography, nano-focus
Original languageEnglish
Pages (from-to)1173-1180
JournalJournal of Synchrotron Radiation
Volume26
Issue number4
Publication statusPublished - 2019 Jul
Publication categoryResearch
Peer-reviewedYes