In-situ manipulations and electrical measurements of III-V nanowhiskers with TEM-STM

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

Abstract

A scanning tunnelling microscope (STM) mounted in a sample holder for a transmission electron microscope (TEM), a TEM-STM, have been used for in-situ electrical measurements of semiconductor nano whiskers. The device enables measurements and manipulations of nano structures while observing them in a TEM

Details

Authors
Organisations
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Chemical Sciences

Keywords

  • transmission electron microscopy, STM, scanning tunnelling microscopy, III-V nanowhiskers, in situ manipulations, electrical measurements, TEM, semiconductor nanowhiskers, nano structures, InAs/InP nanowhisker, InAs-InP
Original languageEnglish
Title of host publication7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science
PublisherLund University
Number of pages2
Publication statusPublished - 2002
Publication categoryResearch
Peer-reviewedYes
EventProceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21) - Malmö, Sweden
Duration: 2002 Jun 242002 Jun 28

Conference

ConferenceProceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
CountrySweden
CityMalmö
Period2002/06/242002/06/28

Bibliographic note

The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Polymer and Materials Chemistry (LTH) (011001041)