Manufacture of High Precision, Multilayer Based Polarimeter Designed for Wide Energy Range from EUV to Soft X-Ray

Research output: Chapter in Book/Report/Conference proceedingPaper in conference proceeding

Abstract

The development of a high precision five rotation axes polarimeter using transmission multilayers as polarizers and reflection multilayers as analyzers is presented. In order to cover a wide energy range from EUV to soft X-ray, a set of Mo/Si, Cr/C, Sc/Cr, and W/B4C multilayers for transmission and reflection have been designed and fabricated. A hexapod support allows to align the polarimeter easily relative to the optical axis, and the instrument is designed to be moved conveniently between different beamlines.

Details

Authors
  • H. Takenaka
  • N. Kuwabara
  • N. Kamachi
  • S. Y. Liu
  • K. Endo
  • T. Ohchi
  • S. Ichimaru
  • H. Kimura
  • J. Laksman
  • F. Hennies
  • W. Grizolli
  • R. Sankari
Organisations
External organisations
  • Japan Synchrotron Radiation Research Institute
  • Toyama Co., Ltd
  • NTT Advanced Technology Co.
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Accelerator Physics and Instrumentation
Original languageEnglish
Title of host publicationX-Ray Lasers 2016 - Proceedings of the 15th International Conference on X-Ray Lasers
PublisherSpringer Science and Business Media, LLC
Pages291-295
Number of pages5
Volume202
ISBN (Print)9783319730240
Publication statusPublished - 2018
Publication categoryResearch
Peer-reviewedYes
Event15th International Conference on X-Ray Lasers, ICXRL 2016 - Nara, Japan
Duration: 2016 May 222016 May 27

Conference

Conference15th International Conference on X-Ray Lasers, ICXRL 2016
CountryJapan
CityNara
Period2016/05/222016/05/27