Measured CMOS Switched High-Quality Capacitors in a Reconfigurable Matching Network

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Abstract

Switched capacitors are here investigated for use in reconfigurable matching networks, particularly for DVB-H frequencies. A 0.13 um CMOS circuit is evaluated through both simulations and measurements. Source grounded NMOS transistors are used to switch high quality metal capacitors located above metal layer 8. The quality factor and tuning range depend on frequency, switch voltage, capacitor size, and transistor width. There is a clear trade-off between quality factor and tuning range, and measurements show quality factors above 50, 100, and 150 at tuning ranges of 3.9, 2.4, and 1.6, respectively. A reconfigurable matching network with the switched capacitors has been realized using external inductors and the measured matching domain for the DVB-H frequency band is shown. The total loss of the network is 1.0 dB, a result of the high quality switched capacitors.

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Subject classification (UKÄ) – MANDATORY

  • Electrical Engineering, Electronic Engineering, Information Engineering

Keywords

  • matching, MEMS, CMOS, switched capacitor, DVB-H
Original languageEnglish
Pages (from-to)858-862
JournalIEEE Transactions on Circuits and Systems II: Express Briefs
Volume54
Issue number10
Publication statusPublished - 2007
Publication categoryResearch
Peer-reviewedYes