Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer

Research output: Contribution to journalArticle

Abstract

X-ray imaging using a Talbot-Lau interferometer, consisting of three binary gratings, is a well-established approach to acquire x-ray phase-contrast and dark-field images with a polychromatic source. However, challenges in the production of high aspect ratio gratings limit the construction of a compact setup for high x-ray energies. In this study we consider the use of phase gratings with triangular-shaped structures in an x-ray interferometer and show that such gratings can yield high visibilities for significantly shorter propagation distances than conventional gratings with binary structures. The findings are supported by simulation and experimental results for both cases of a monochromatic and a polychromatic source.

Details

Authors
  • Andre Yaroshenko
  • Martin Bech
  • Guillaume Potdevin
  • Andreas Malecki
  • Thomas Biernath
  • Johannes Wolf
  • Arne Tapfer
  • Markus Schüttler
  • Jan Meiser
  • Danays Kunka
  • Maximilian Amberger
  • Juergen Mohr
  • Franz Pfeiffer
Organisations
External organisations
  • Technical University of Munich
  • Karlsruhe Institute of Technology
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Other Physics Topics
  • Radiology, Nuclear Medicine and Medical Imaging

Keywords

  • Computer Simulation, Computer-Aided Design, Equipment Design, Equipment Failure Analysis, Interferometry/instrumentation, Lighting/instrumentation, Models, Theoretical, Refractometry/instrumentation, X-Ray Diffraction/instrumentation
Original languageEnglish
Pages (from-to)547-56
Number of pages10
JournalOptics Express
Volume22
Issue number1
Publication statusPublished - 2014 Jan 13
Publication categoryResearch
Peer-reviewedYes