Photoelectron spectroscopy study of Ag/Si(111)root 3X root 3 and the effect of additional Ag adatoms

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Abstract

High-resolution core-level spectroscopy has been applied to the Ag/Si(111)root3xroot3 surface. The Si 2p line shape is found to depend critically on the presence of additional Ag adatoms on the surface. A significant broadening caused by the surplus of Ag atoms could be eliminated by careful annealing. The resulting Si 2p spectra are significantly sharper than any published data for this or other Si based surface systems. Two major surface components are identified for the root3xroot3 surface, which find a natural explanation in terms of the honeycomb-chained-trimer model. A small but characteristic contribution to the Si 2p spectrum of the Ag/root3xroot3 surface is tentatively assigned to defects.

Details

Authors
  • RIG Uhrberg
  • HM Zhang
  • Balasubramanian Thiagarajan
  • E Landemark
  • HW Yeom
Organisations
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Natural Sciences
  • Physical Sciences
Original languageEnglish
JournalPhysical Review B (Condensed Matter and Materials Physics)
Volume65
Issue number8
Publication statusPublished - 2002
Publication categoryResearch
Peer-reviewedYes