Ptychographic characterization of a coherent nanofocused X-ray beam

Research output: Contribution to journalArticle

Abstract

The NanoMAX hard X-ray nanoprobe is the first beamline to take full advantage of the diffraction-limited storage ring at the MAX IV synchrotron and delivers a high coherent photon flux for applications in diffraction and imaging. Here, we characterize its coherent and focused beam using ptychographic analysis. We derive beam profiles in the energy range 6-22 keV and estimate the coherent flux based on a probe mode decomposition approach.

Details

Authors
Organisations
External organisations
  • Stockholm University
  • KTH Royal Institute of Technology
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Atom and Molecular Physics and Optics
Original languageEnglish
Pages (from-to)5069-5076
Number of pages8
JournalOptics Express
Volume28
Issue number4
Publication statusPublished - 2020 Feb 17
Publication categoryResearch
Peer-reviewedYes