Resonant inelastic X-ray scattering at the K edge of oxygen and fluorine in insulators
Research output: Contribution to journal › Article
Here we present the results of a study of the electronic structure using the resonant inelastic scattering process at the F 1s photoabsorption edge in LiF and O 1s edge of MgO crystals. In case of excitations in the sub-threshold region, the Raman-type linear dispersion of X-ray fluorescence peak was observed for the studied compounds. In LiF, the narrowing of the X-ray fluorescence peak is observed at pre-threshold excitation, which can be related to the creation of a core exciton, but no core excitons were identified in MgO.
|Research areas and keywords||
Subject classification (UKÄ) – MANDATORY
|Journal||Journal of Electron Spectroscopy and Related Phenomena|
|Publication status||Published - 2005|