Resonant inelastic X-ray scattering at the K edge of oxygen and fluorine in insulators

Research output: Contribution to journalArticle

Abstract

Here we present the results of a study of the electronic structure using the resonant inelastic scattering process at the F 1s photoabsorption edge in LiF and O 1s edge of MgO crystals. In case of excitations in the sub-threshold region, the Raman-type linear dispersion of X-ray fluorescence peak was observed for the studied compounds. In LiF, the narrowing of the X-ray fluorescence peak is observed at pre-threshold excitation, which can be related to the creation of a core exciton, but no core excitons were identified in MgO.

Details

Authors
  • A Kikas
  • Tanel Käämbre
  • V Kisand
  • A Saar
  • K Kooser
  • E Nommiste
  • Indrek Martinson
Organisations
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Physical Sciences
  • Natural Sciences

Keywords

  • resonant inelastic X-ray scattering, X-ray emission, core exciton
Original languageEnglish
Pages (from-to)845-848
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume144-147
Publication statusPublished - 2005
Publication categoryResearch
Peer-reviewedYes