Spectrally resolved x-ray beam induced current in a single InGaP nanowire

Research output: Contribution to journalArticle

Abstract

We demonstrate x-ray absorption fine structure spectroscopy (XAFS) detected by x-ray beam induced current (XBIC) in single n + -i-n + doped nanowire devices. Spatial scans with the 65 nm diameter beam show a peak of the XBIC signal in the middle segment of the nanowire. The XBIC and the x-ray fluorescence signals were detected simultaneously as a function of the excitation energy near the Ga K absorption edge at 10.37 keV. The spectra show similar oscillations around the edge, which shows that the XBIC is limited by the primary absorption. Our results reveal the feasibility of the XBIC detection mode for the XAFS investigation in nanostructured devices.

Details

Authors
Organisations
External organisations
  • European Synchrotron Radiation Facility
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Condensed Matter Physics
  • Nano Technology

Keywords

  • nanowire, x-ray absorption fine structure spectroscopy (XAFS), x-ray beam induced current (XBIC)
Original languageEnglish
Article number454001
JournalNanotechnology
Volume29
Issue number45
Publication statusPublished - 2018 Sep 10
Publication categoryResearch
Peer-reviewedYes