X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level
Research output: Contribution to journal › Article
Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.
|Research areas and keywords||
Subject classification (UKÄ) – MANDATORY
|Journal||Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment|
|Publication status||Published - 1970|
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)