X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

Research output: Contribution to journalArticle

Abstract

Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.

Details

Authors
Organisations
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Subatomic Physics
  • Production Engineering, Human Work Science and Ergonomics

Keywords

  • PIXE, particle induced X-ray emission analysis, trace element analysis
Original languageEnglish
Pages (from-to)141-143
JournalNuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume84
Issue number1
Publication statusPublished - 1970
Publication categoryResearch
Peer-reviewedYes

Bibliographic note

The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)