X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment.
Research output: Contribution to journal › Article
The spatial strain distribution in and around a single axial InAs1-xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero-segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.
|Research areas and keywords||
Subject classification (UKÄ) – MANDATORY
|Journal||Journal of Synchrotron Radiation|
|Issue number||Pt 1|
|Publication status||Published - 2015|