X-ray Spectrometer

Research output: Patent


An x-ray spectrometer includes: an x-ray plasma source that produces first x-rays; an x-ray optic in optical communication with the x-ray plasma source and that: receives the first x-rays from the x-ray plasma source; focuses the first x-rays to produce second x-rays; and communicates the second x-rays to a sample that produces product x-rays in response to receipt of the second x-rays and second light; and a microcalorimeter array detector in optical communication with the sample and that receives the product x-rays from the sample.


  • J N Ullom (Inventor)
  • Galen O'Neil (Inventor)
  • Luis Miaja Avila (Inventor)
  • Kevin Silverman (Inventor)
  • Daniel S. Swetz (Inventor)
  • Ralph Jimenez (Inventor)
  • W B Doriese (Inventor)
  • Gene C. Hilton (Inventor)
  • Carl D. Reintsema (Inventor)
  • Daniel Schmidt (Inventor)
  • Bradley K. Alpert (Inventor)
  • Jens Uhlig (Inventor)
  • Young Il Joe (Inventor)
  • Wilfred Fullagar (Inventor)
  • Villy Sundström (Inventor)
  • Ilari J. Maasilta (Inventor)
  • Joseph W. Fowler (Inventor)
External organisations
  • National Institute of Standards and Technology (NIST)
  • University of Jyväskylä
Research areas and keywords

Subject classification (UKÄ) – MANDATORY

  • Accelerator Physics and Instrumentation
Original languageEnglish
Patent number20190064084
IPCG01N23/223; G01N23/207; G01T1/36; H05G2/00
Filing date2018/01/09
Publication statusPublished - 2019 Feb 28
Publication categoryResearch