ACS Applied Electronic Materials, 2637-6113

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  1. Artikel i vetenskaplig tidskrift
  2. Atomic Layer Deposition of Hafnium Oxide on InAs: Insight from Time-Resolved in Situ Studies

    Giulio D'Acunto, Andrea Troian, Esko Kokkonen, Foqia Rehman, Yen Po Liu, Sofie Yngman, Zhihua Yong, Sarah R. McKibbin, Tamires Gallo, Erik Lind, Joachim Schnadt & Rainer Timm, 2020 dec 22, I: ACS Applied Electronic Materials. 2, 12, s. 3915-3922 8 s.

    Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

  3. Electronic Structure and Trap States of Two-Dimensional Ruddlesden–Popper Perovskites with the Relaxed Goldschmidt Tolerance Factor

    Mingli Liang, Weihua Lin, Zhenyun Lan, Jie Meng, Qian Zhao, Xianshao Zou, Ivano E. Castelli, Tönu Pullerits, Sophie E. Canton & Kaibo Zheng, 2020, I: ACS Applied Electronic Materials. 2, 5, s. 1402-1412

    Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

  4. Översiktsartikel
  5. Room temperature multiferroic PZTFT thin films

    Yuan-Chih Wu, Shang Zhu Ho, Yu Chen Liu, Yi-De Liou, Wen-Yan Liu, Shih-Wen Huang, Jie Jiang, Yi-Chun Chen & Jan-Chi Yang, 2019, I: ACS Applied Electronic Materials. 2, 1, s. 19-24 6 s.

    Forskningsoutput: TidskriftsbidragÖversiktsartikel