Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire

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Three-dimensional (3D) Bragg coherent x-ray diffractive imaging (CXDI) with a nanofocused beam was applied to quantitatively map the internal strain field of a single indium phosphide nanowire. The quantitative values of the strain were obtained by pre-characterization of the beam profile with transmission ptychography on a test sample. Our measurements revealed the 3D strain distribution in a region of 150 nm below the catalyst Au particle. We observed a slight gradient of the strain in the range of 0.6% along the [111] growth direction of the nanowire. We also determined the spatial resolution in our measurements to be about 10 nm in the direction perpendicular to the facets of the nanowire. The CXDI measurements were compared with the finite element method simulations and show a good agreement with our experimental results. The proposed approach can become an effective tool for in operando studies of the nanowires.


Enheter & grupper
Externa organisationer
  • German Electron Synchrotron (DESY)
  • University of Copenhagen
  • University of Potsdam
  • European XFEL GmbH
  • Dresden University of Technology
  • University of California, San Diego
  • National Research Nuclear University MEPhI
  • Tomsk Polytechnic University
  • Center for Free-Electron Laser Science
  • University of Hamburg

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Acceleratorfysik och instrumentering
  • Nanoteknik


TidskriftJournal of Optics
StatusPublished - 2016 jun 1
Peer review utfördJa