Combining Nanofocused X-Rays with Electrical Measurements at the NanoMAX Beamline

Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

Abstract

The advent of nanofocused X-ray beams has allowed the study of single nanocrystals and complete nanoscale devices in a nondestructive manner, using techniques such as scanning transmission X-ray microscopy (STXM), X-ray fluorescence (XRF) and X-ray diffraction (XRD). Further insight into semiconductor devices can be achieved by combining these techniques with simultaneous electrical measurements. Here, we present a system for electrical biasing and current measurement of single nanostructure devices, which has been developed for the NanoMAX beamline at the fourth-generation synchrotron, MAX IV, Sweden. The system was tested on single InP nanowire devices. The mechanical stability was sufficient to collect scanning XRD and XRF maps with a 50 nm diameter focus. The dark noise of the current measurement system was about 3 fA, which allowed fly scan measurements of X-ray beam induced current (XBIC) in single nanowire devices.

Detaljer

Författare
Enheter & grupper
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Acceleratorfysik och instrumentering

Nyckelord

Originalspråkengelska
Artikelnummer432
TidskriftCrystals
Volym9
Utgåva nummer8
StatusPublished - 2019 aug 1
PublikationskategoriForskning
Peer review utfördJa

Relaterad forskningsoutput

Lert Chayanun, 2020 nov 10, Lund University. 97 s.

Forskningsoutput: AvhandlingDoktorsavhandling (sammanläggning)

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