Single crystal thin films of 10% yttrium doped barium zirconate (BZY10) have been prepared using chemical solution deposition on magnesium oxide substrates and annealed at 800 or 1000 degrees C. A focused ion beam lift out technique was used to prepare thin (< 100 nm) specimens for transmission electron microscopy (TEM) analysis. A variety of TEM based techniques were used for characterization, including high resolution imaging, X-ray energy dispersive spectroscopy and energy filtered TEM. High resolution TEM imaging indicated a high quality single crystal film with an epitaxial cube on cube type interface between BZY10 and MgO. For the sample annealed 1000 degrees C, annular dark field imaging in scanning transmission electron microscopy (STEM) mode showed a layered pattern of lower intensity in the single crystal film. Energy filtered TEM thickness map together with scanning electron microscopy (SEM) indicate the pattern consists of partially repeating voids.
|Titel på värdpublikation||ECS Transactions|
|Status||Published - 2012|
|Peer review utförd||Ja|
|Evenemang||Symposium on Ionic and Mixed Conducting Ceramics 8 - Seattle, WA|
Varaktighet: 2012 maj 6 → 2012 maj 10
|Konferens||Symposium on Ionic and Mixed Conducting Ceramics 8|
|Period||2012/05/06 → 2012/05/10|