Excited Carrier Recombination in Black Silicon

Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceeding

Abstract

This presentation is on ultrafast photoluminescence recombination phenomena from black silicon consisting of quantum pillars produced by plasma ion etching. An ultrafast blue luminescence component competing with non-radiative recombination at surface defects was quantified as originating from the no-phonon recombination. This component involves two decay processes with a peak energy at around 480 nm, which have the fast component of about 10 ps followed by a component of about 50 ps decay time constant. The emission exhibits also a slow component in the red spectral region with a time constant of about 1.5-2.5 ns. When black Si is oxidized, the slow band at around 600 nm is enhanced in intensity to the detriment of blue-green emission band. This process results in a much slower sates assuming a 3-component exponential decay as measured by Streak camera. The ultrafast PL decay leads to a transfer of carriers to long-lived defect states as evidenced by a red emission at around 2 eV. Time-correlated single photon counting revealed a life-time of about few ns for these states. The results are discussed in terms of band structure modification at reduced sizes and defects at surfaces.

Detaljer

Författare
Enheter & grupper
Externa organisationer
  • Bahçeşehir University
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Fysikalisk kemi

Nyckelord

Originalspråkengelska
Titel på värdpublikation2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2020
FörlagInstitute of Electrical and Electronics Engineers Inc.
ISBN (elektroniskt)9781728187655
StatusPublished - 2020 sep 1
PublikationskategoriForskning
Peer review utfördJa
Evenemang2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2020 - Caen, Frankrike
Varaktighet: 2020 sep 12020 sep 30

Publikationsserier

Namn2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2020

Konferens

Konferens2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EUROSOI-ULIS 2020
LandFrankrike
OrtCaen
Period2020/09/012020/09/30