Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system

Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

Abstract

The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit. In quasi-coherent operation, beam sizes of down to 56 nm (FWHM, horizontal direction) can be achieved. Comparing measured Airy-like fringe patterns with simulations, the degree of coherence |μ| has been quantified as a function of the secondary source aperture (SSA); the coherence is larger than 50% for SSA sizes below 11 µm at hard X-ray energies of 14 keV. For an SSA size of 5 µm, the degree of coherence has been determined to be 87%.

Detaljer

Författare
Enheter & grupper
Externa organisationer
  • University of Göttingen
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Acceleratorfysik och instrumentering
  • Materialkemi

Nyckelord

Originalspråkengelska
Sidor (från-till)1173-1180
TidskriftJournal of Synchrotron Radiation
Volym26
Utgåva nummer4
StatusPublished - 2019 jul
PublikationskategoriForskning
Peer review utfördJa