IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks

Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceeding

Abstract

We address access control of reconfigurable scan networks, like IEEE Std. 1687 networks. We propose an on- chip test block to perform: (1) test for faulty scan-chains, (2) localization of faulty scan-chains and (3) repair by excluding faulty scan-chains, and an access control block to (1) control so scan- chains (instruments) are only accessed in allowed combinations, (2) detection of access attempts to instrument in not allowed combinations, and (3) monitoring how theses attempts are made. The key features are two-fold. First, in respect to operation and maintenance. If the physical implementation of an IEEE Std. 1687 network changes due to faults, the instrument connectivity language (ICL) and procedural description language (PDL) need to be updated. To avoid keeping track and updating ICL and PDL for each individual integrated circuit (IC), proposed test block, placed at each IC, makes adjustments of PDL according to the faults of the particular IC. Second, a centralized access control block with key information about the network to detect and handle un- authorized access.

Detaljer

Författare
Enheter & grupper
Externa organisationer
  • Lund University
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Annan elektroteknik och elektronik
Originalspråkengelska
Titel på värdpublikation2020 IEEE European Test Symposium (ETS)
FörlagInstitute of Electrical and Electronics Engineers Inc.
Antal sidor2
ISBN (elektroniskt)978-1-7281-4312-5
StatusPublished - 2020
PublikationskategoriForskning
Peer review utfördJa
Evenemang25th IEEE European Test Symposium (ETS) - Tallinn, Estland
Varaktighet: 2020 maj 252020 maj 29

Konferens

Konferens25th IEEE European Test Symposium (ETS)
LandEstland
OrtTallinn
Period2020/05/252020/05/29

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