Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources

Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

Abstract

Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.

Detaljer

Författare
  • Patrik Vagovič
  • Tokushi Sato
  • Ladislav Mikeš
  • Grant Mills
  • Rita Graceffa
  • Frans Mattsson
  • Alexey Ershov
  • Tomáš Faragó
  • Jozef Uličný
  • Henry Kirkwood
  • Romain Letrun
  • Marie Christine Zdora
  • Margie P. Olbinado
  • Alexander Rack
  • Tilo Baumbach
  • Joachim Schulz
  • Alke Meents
  • Henry N. Chapman
  • Adrian P. Mancuso
Enheter & grupper
Externa organisationer
  • Center for Free-Electron Laser Science
  • European XFEL GmbH
  • Fyzikální ústav AV ČR, v. v. i.
  • Lund University
  • Karlsruhe Institute of Technology
  • Pavol Jozef Safarik University in Kosice
  • Diamond Light Source
  • Royal Free Hospital
  • University of Southampton
  • European Synchrotron Radiation Facility
  • La Trobe University
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Den kondenserade materiens fysik
Originalspråkengelska
Sidor (från-till)1106-1109
Antal sidor4
TidskriftOptica
Volym6
Utgåva nummer9
StatusPublished - 2019 jan 1
PublikationskategoriForskning
Peer review utfördJa