Moiré method for nanometer instability investigation of scanning hard x-ray microscopes

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Moiré method for nanometer instability investigation of scanning hard x-ray microscopes. / Vogt, Ulrich; Köhler, Daniel; Dickmann, Jannis; Rahomäki, Jussi; Parfeniukas, Karolis; Kubsky, Stefan; Alves, Filipe; Langlois, Florent; Engblom, Christer; Stankevic, Tomas.

I: Optics Express, Vol. 25, Nr. 11, 29.05.2017, s. 12188-12194.

Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

Harvard

Vogt, U, Köhler, D, Dickmann, J, Rahomäki, J, Parfeniukas, K, Kubsky, S, Alves, F, Langlois, F, Engblom, C & Stankevic, T 2017, 'Moiré method for nanometer instability investigation of scanning hard x-ray microscopes', Optics Express, vol. 25, nr. 11, s. 12188-12194. https://doi.org/10.1364/OE.25.012188

APA

Vogt, U., Köhler, D., Dickmann, J., Rahomäki, J., Parfeniukas, K., Kubsky, S., ... Stankevic, T. (2017). Moiré method for nanometer instability investigation of scanning hard x-ray microscopes. Optics Express, 25(11), 12188-12194. https://doi.org/10.1364/OE.25.012188

CBE

Vogt U, Köhler D, Dickmann J, Rahomäki J, Parfeniukas K, Kubsky S, Alves F, Langlois F, Engblom C, Stankevic T. 2017. Moiré method for nanometer instability investigation of scanning hard x-ray microscopes. Optics Express. 25(11):12188-12194. https://doi.org/10.1364/OE.25.012188

MLA

Vancouver

Vogt U, Köhler D, Dickmann J, Rahomäki J, Parfeniukas K, Kubsky S et al. Moiré method for nanometer instability investigation of scanning hard x-ray microscopes. Optics Express. 2017 maj 29;25(11):12188-12194. https://doi.org/10.1364/OE.25.012188

Author

Vogt, Ulrich ; Köhler, Daniel ; Dickmann, Jannis ; Rahomäki, Jussi ; Parfeniukas, Karolis ; Kubsky, Stefan ; Alves, Filipe ; Langlois, Florent ; Engblom, Christer ; Stankevic, Tomas. / Moiré method for nanometer instability investigation of scanning hard x-ray microscopes. I: Optics Express. 2017 ; Vol. 25, Nr. 11. s. 12188-12194.

RIS

TY - JOUR

T1 - Moiré method for nanometer instability investigation of scanning hard x-ray microscopes

AU - Vogt, Ulrich

AU - Köhler, Daniel

AU - Dickmann, Jannis

AU - Rahomäki, Jussi

AU - Parfeniukas, Karolis

AU - Kubsky, Stefan

AU - Alves, Filipe

AU - Langlois, Florent

AU - Engblom, Christer

AU - Stankevic, Tomas

PY - 2017/5/29

Y1 - 2017/5/29

N2 - We present a Moiré method that can be used to investigate positional instabilities in a scanning hard x-ray microscope with nanometer precision. The development of diffractionlimited storage rings offering highly-brilliant synchrotron radiation and improvements of nanofocusing x-ray optics paves the way towards 3D nanotomography with 10 nm resolution or below. However, this trend demands improved designs of x-ray microscope instruments which should offer few-nm beam stabilities with respect to the sample. Our technique can measure the position of optics and sample stage relative to each other in the two directions perpendicular to the beam propagation in a scanning x-ray microscope using simple optical components and visible light. The usefulness of the method was proven by measuring short and long term instabilities of a zone-plate-optics-based prototype microscope. We think it can become an important tool for the characterization of scanning x-ray microscopes, especially prior to experiments with an actual x-ray beam.

AB - We present a Moiré method that can be used to investigate positional instabilities in a scanning hard x-ray microscope with nanometer precision. The development of diffractionlimited storage rings offering highly-brilliant synchrotron radiation and improvements of nanofocusing x-ray optics paves the way towards 3D nanotomography with 10 nm resolution or below. However, this trend demands improved designs of x-ray microscope instruments which should offer few-nm beam stabilities with respect to the sample. Our technique can measure the position of optics and sample stage relative to each other in the two directions perpendicular to the beam propagation in a scanning x-ray microscope using simple optical components and visible light. The usefulness of the method was proven by measuring short and long term instabilities of a zone-plate-optics-based prototype microscope. We think it can become an important tool for the characterization of scanning x-ray microscopes, especially prior to experiments with an actual x-ray beam.

UR - http://www.scopus.com/inward/record.url?scp=85019983867&partnerID=8YFLogxK

U2 - 10.1364/OE.25.012188

DO - 10.1364/OE.25.012188

M3 - Article

VL - 25

SP - 12188

EP - 12194

JO - Optics Express

T2 - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 11

ER -