Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer

Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

Standard

Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer. / Yaroshenko, Andre; Bech, Martin; Potdevin, Guillaume; Malecki, Andreas; Biernath, Thomas; Wolf, Johannes; Tapfer, Arne; Schüttler, Markus; Meiser, Jan; Kunka, Danays; Amberger, Maximilian; Mohr, Juergen; Pfeiffer, Franz.

I: Optics Express, Vol. 22, Nr. 1, 13.01.2014, s. 547-56.

Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

Harvard

Yaroshenko, A, Bech, M, Potdevin, G, Malecki, A, Biernath, T, Wolf, J, Tapfer, A, Schüttler, M, Meiser, J, Kunka, D, Amberger, M, Mohr, J & Pfeiffer, F 2014, 'Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer', Optics Express, vol. 22, nr. 1, s. 547-56. https://doi.org/10.1364/OE.22.000547

APA

Yaroshenko, A., Bech, M., Potdevin, G., Malecki, A., Biernath, T., Wolf, J., ... Pfeiffer, F. (2014). Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer. Optics Express, 22(1), 547-56. https://doi.org/10.1364/OE.22.000547

CBE

Yaroshenko A, Bech M, Potdevin G, Malecki A, Biernath T, Wolf J, Tapfer A, Schüttler M, Meiser J, Kunka D, Amberger M, Mohr J, Pfeiffer F. 2014. Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer. Optics Express. 22(1):547-56. https://doi.org/10.1364/OE.22.000547

MLA

Vancouver

Yaroshenko A, Bech M, Potdevin G, Malecki A, Biernath T, Wolf J et al. Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer. Optics Express. 2014 jan 13;22(1):547-56. https://doi.org/10.1364/OE.22.000547

Author

Yaroshenko, Andre ; Bech, Martin ; Potdevin, Guillaume ; Malecki, Andreas ; Biernath, Thomas ; Wolf, Johannes ; Tapfer, Arne ; Schüttler, Markus ; Meiser, Jan ; Kunka, Danays ; Amberger, Maximilian ; Mohr, Juergen ; Pfeiffer, Franz. / Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer. I: Optics Express. 2014 ; Vol. 22, Nr. 1. s. 547-56.

RIS

TY - JOUR

T1 - Non-binary phase gratings for x-ray imaging with a compact Talbot interferometer

AU - Yaroshenko, Andre

AU - Bech, Martin

AU - Potdevin, Guillaume

AU - Malecki, Andreas

AU - Biernath, Thomas

AU - Wolf, Johannes

AU - Tapfer, Arne

AU - Schüttler, Markus

AU - Meiser, Jan

AU - Kunka, Danays

AU - Amberger, Maximilian

AU - Mohr, Juergen

AU - Pfeiffer, Franz

PY - 2014/1/13

Y1 - 2014/1/13

N2 - X-ray imaging using a Talbot-Lau interferometer, consisting of three binary gratings, is a well-established approach to acquire x-ray phase-contrast and dark-field images with a polychromatic source. However, challenges in the production of high aspect ratio gratings limit the construction of a compact setup for high x-ray energies. In this study we consider the use of phase gratings with triangular-shaped structures in an x-ray interferometer and show that such gratings can yield high visibilities for significantly shorter propagation distances than conventional gratings with binary structures. The findings are supported by simulation and experimental results for both cases of a monochromatic and a polychromatic source.

AB - X-ray imaging using a Talbot-Lau interferometer, consisting of three binary gratings, is a well-established approach to acquire x-ray phase-contrast and dark-field images with a polychromatic source. However, challenges in the production of high aspect ratio gratings limit the construction of a compact setup for high x-ray energies. In this study we consider the use of phase gratings with triangular-shaped structures in an x-ray interferometer and show that such gratings can yield high visibilities for significantly shorter propagation distances than conventional gratings with binary structures. The findings are supported by simulation and experimental results for both cases of a monochromatic and a polychromatic source.

KW - Computer Simulation

KW - Computer-Aided Design

KW - Equipment Design

KW - Equipment Failure Analysis

KW - Interferometry/instrumentation

KW - Lighting/instrumentation

KW - Models, Theoretical

KW - Refractometry/instrumentation

KW - X-Ray Diffraction/instrumentation

U2 - 10.1364/OE.22.000547

DO - 10.1364/OE.22.000547

M3 - Article

VL - 22

SP - 547

EP - 556

JO - Optics Express

JF - Optics Express

SN - 1094-4087

IS - 1

ER -