Non-uniform nanosecond gate-delay of hybrid pixel detectors
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A simple experiment to characterize the gating properties of X-ray area detectors using pulsed X-ray sources is presented. For a number of time-resolved experiments the gating uniformity of area detectors is important. Relative gating delays between individual modules and readout chips of PILATUS2 series area X-ray detectors have been observed. For three modules of a PILATUS300K-W unit the maximum gating offset between the modules is found to be as large as 30ns. On average, the first photosensor module is found to be triggered 15ns and 30ns later than the second and the third modules, respectively.The gating uniformity of Pilatus area X-ray detectors was characterized using synchrotron radiation. Gating offsets of more than 15ns were observed between different modules of a Pilatus300K-W detector.
|Tidskrift||Journal of Synchrotron Radiation|
|Status||Published - 2017 sep 1|
|Peer review utförd||Ja|