Off-axis reflection zone plate for quantitative soft x-ray source characterization

Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

Abstract

A compact system for high-resolution spectroscopy and quantitative photon flux and brilliance measurements of pulsed soft x-ray sources is described. The calibrated system combines a novel elliptical off-axis reflection zone plate with charge-coupled device detection for simultaneous spectral and spatial measurements. Experiments on a water-window droplet-target laser-plasma source demonstrate lambda/Delta lambda greater than or equal to 1000 spectral resolution and absolute flux and brilliance measurements. (C) 1997 American Institute of Physics.

Detaljer

Författare
  • T Wilhein
  • D Hambach
  • B Niemann
  • M Berglund
  • Lars Rymell
  • H. M Hertz
Enheter & grupper
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Atom- och molekylfysik och optik
Originalspråkengelska
Sidor (från-till)190-192
TidskriftApplied Physics Letters
Volym71
Utgåva nummer2
StatusPublished - 1997
PublikationskategoriForskning
Peer review utfördJa

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