Ptychographic characterization of a coherent nanofocused X-ray beam

Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

Abstract

The NanoMAX hard X-ray nanoprobe is the first beamline to take full advantage of the diffraction-limited storage ring at the MAX IV synchrotron and delivers a high coherent photon flux for applications in diffraction and imaging. Here, we characterize its coherent and focused beam using ptychographic analysis. We derive beam profiles in the energy range 6-22 keV and estimate the coherent flux based on a probe mode decomposition approach.

Detaljer

Författare
Enheter & grupper
Externa organisationer
  • Stockholms universitet
  • KTH Royal Institute of Technology
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Atom- och molekylfysik och optik
Originalspråkengelska
Sidor (från-till)5069-5076
Antal sidor8
TidskriftOptics Express
Volym28
Utgåva nummer4
StatusPublished - 2020 feb 17
PublikationskategoriForskning
Peer review utfördJa