Resonant inelastic X-ray scattering at the K edge of oxygen and fluorine in insulators

Forskningsoutput: TidskriftsbidragArtikel i vetenskaplig tidskrift

Abstract

Here we present the results of a study of the electronic structure using the resonant inelastic scattering process at the F 1s photoabsorption edge in LiF and O 1s edge of MgO crystals. In case of excitations in the sub-threshold region, the Raman-type linear dispersion of X-ray fluorescence peak was observed for the studied compounds. In LiF, the narrowing of the X-ray fluorescence peak is observed at pre-threshold excitation, which can be related to the creation of a core exciton, but no core excitons were identified in MgO.

Detaljer

Författare
  • A Kikas
  • Tanel Käämbre
  • V Kisand
  • A Saar
  • K Kooser
  • E Nommiste
  • Indrek Martinson
Enheter & grupper
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Fysik
  • Naturvetenskap

Nyckelord

Originalspråkengelska
Sidor (från-till)845-848
TidskriftJournal of Electron Spectroscopy and Related Phenomena
Volym144-147
StatusPublished - 2005
PublikationskategoriForskning
Peer review utfördJa