Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge

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Abstract

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.

Detaljer

Författare
  • Didem Ketenoglu
  • Manuel Harder
  • Konstantin Klementiev
  • Mary Upton
  • Mehran Taherkhani
  • Manfred Spiwek
  • Frank-Uwe Dill
  • Hans-Christian Wille
  • Hasan Yavas
Enheter & grupper
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Atom- och molekylfysik och optik

Nyckelord

Originalspråkengelska
Sidor (från-till)961-967
TidskriftJournal of Synchrotron Radiation
Volym22
StatusPublished - 2015
PublikationskategoriForskning
Peer review utfördJa