Sensitivity of Website Reliability to Usage Profile Changes

Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceeding

Standard

Sensitivity of Website Reliability to Usage Profile Changes. / Weyns, Kim; Höst, Martin.

The 18th IEEE International Symposium on Software Reliability (ISSRE '07),. IEEE - Institute of Electrical and Electronics Engineers Inc., 2007. s. 3-8.

Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceeding

Harvard

Weyns, K & Höst, M 2007, Sensitivity of Website Reliability to Usage Profile Changes. i The 18th IEEE International Symposium on Software Reliability (ISSRE '07),. IEEE - Institute of Electrical and Electronics Engineers Inc., s. 3-8, 18th IEEE International Symposium on Software Reliability Engineering, Trollhättan, Sverige, 2007/11/05. https://doi.org/10.1109/ISSRE.2007.26

APA

Weyns, K., & Höst, M. (2007). Sensitivity of Website Reliability to Usage Profile Changes. I The 18th IEEE International Symposium on Software Reliability (ISSRE '07), (s. 3-8). IEEE - Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSRE.2007.26

CBE

Weyns K, Höst M. 2007. Sensitivity of Website Reliability to Usage Profile Changes. I The 18th IEEE International Symposium on Software Reliability (ISSRE '07),. IEEE - Institute of Electrical and Electronics Engineers Inc. s. 3-8. https://doi.org/10.1109/ISSRE.2007.26

MLA

Weyns, Kim och Martin Höst "Sensitivity of Website Reliability to Usage Profile Changes". The 18th IEEE International Symposium on Software Reliability (ISSRE '07),. IEEE - Institute of Electrical and Electronics Engineers Inc. 2007, 3-8. https://doi.org/10.1109/ISSRE.2007.26

Vancouver

Weyns K, Höst M. Sensitivity of Website Reliability to Usage Profile Changes. I The 18th IEEE International Symposium on Software Reliability (ISSRE '07),. IEEE - Institute of Electrical and Electronics Engineers Inc. 2007. s. 3-8 https://doi.org/10.1109/ISSRE.2007.26

Author

Weyns, Kim ; Höst, Martin. / Sensitivity of Website Reliability to Usage Profile Changes. The 18th IEEE International Symposium on Software Reliability (ISSRE '07),. IEEE - Institute of Electrical and Electronics Engineers Inc., 2007. s. 3-8

RIS

TY - GEN

T1 - Sensitivity of Website Reliability to Usage Profile Changes

AU - Weyns, Kim

AU - Höst, Martin

PY - 2007

Y1 - 2007

N2 - To measure the reliability of a website from a user’s point of view, the uncertainty on the usage of the website has to be taken into account. In this paper we investigate the influence of this uncertainty on the reliability estimate for a web server. For this purpose a session based Markov model is used to model the usage extracted from the server’s logfiles. From these logfiles a complete user profile can be extracted together with an estimate of the uncertainty on this user profile. This paper investigates the applicability of this kind of Markov model on web server reliability and discusses the difficulties with data extraction from the logfiles. Advantages and disadvantages of this approach are discussed and the approach is applied to data from a university department’s web server to demonstrate its applicability.

AB - To measure the reliability of a website from a user’s point of view, the uncertainty on the usage of the website has to be taken into account. In this paper we investigate the influence of this uncertainty on the reliability estimate for a web server. For this purpose a session based Markov model is used to model the usage extracted from the server’s logfiles. From these logfiles a complete user profile can be extracted together with an estimate of the uncertainty on this user profile. This paper investigates the applicability of this kind of Markov model on web server reliability and discusses the difficulties with data extraction from the logfiles. Advantages and disadvantages of this approach are discussed and the approach is applied to data from a university department’s web server to demonstrate its applicability.

U2 - 10.1109/ISSRE.2007.26

DO - 10.1109/ISSRE.2007.26

M3 - Paper in conference proceeding

SN - 978-0-7695-3024-6

SP - 3

EP - 8

BT - The 18th IEEE International Symposium on Software Reliability (ISSRE '07),

PB - IEEE - Institute of Electrical and Electronics Engineers Inc.

T2 - 18th IEEE International Symposium on Software Reliability Engineering

Y2 - 5 November 2007 through 9 November 2007

ER -