Spectrally resolved x-ray beam induced current in a single InGaP nanowire

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Abstract

We demonstrate x-ray absorption fine structure spectroscopy (XAFS) detected by x-ray beam induced current (XBIC) in single n + -i-n + doped nanowire devices. Spatial scans with the 65 nm diameter beam show a peak of the XBIC signal in the middle segment of the nanowire. The XBIC and the x-ray fluorescence signals were detected simultaneously as a function of the excitation energy near the Ga K absorption edge at 10.37 keV. The spectra show similar oscillations around the edge, which shows that the XBIC is limited by the primary absorption. Our results reveal the feasibility of the XBIC detection mode for the XAFS investigation in nanostructured devices.

Detaljer

Författare
Enheter & grupper
Externa organisationer
  • European Synchrotron Radiation Facility
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Den kondenserade materiens fysik
  • Nanoteknik

Nyckelord

Originalspråkengelska
Artikelnummer454001
TidskriftNanotechnology
Volym29
Utgivningsnummer45
StatusPublished - 2018 sep 10
PublikationskategoriForskning
Peer review utfördJa