X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment.

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Abstract

The spatial strain distribution in and around a single axial InAs1-xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero-segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.

Detaljer

Författare
Enheter & grupper
Forskningsområden

Ämnesklassifikation (UKÄ) – OBLIGATORISK

  • Acceleratorfysik och instrumentering
Originalspråkengelska
Sidor (från-till)59-66
TidskriftJournal of Synchrotron Radiation
Volym22
Utgåva nummerPt 1
StatusPublished - 2015
PublikationskategoriForskning
Peer review utfördJa