X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment.

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Bibtex

@article{1bd0db7f4fc5433d931377099a3325eb,
title = "X-ray diffraction strain analysis of a single axial InAs1-xPx nanowire segment.",
abstract = "The spatial strain distribution in and around a single axial InAs1-xPx hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire's inhomogeneous strain state was achieved. This allows for a detailed understanding of how the variation of the nanowire's and hetero-segment's dimensions affect the strain in its core region and in the region close to the nanowire's side facets. Moreover, ensemble-averaging high-resolution diffraction experiments were used to determine statistical information on the distribution of wurtzite and zinc-blende crystal polytypes in the nanowires.",
author = "Mario Keplinger and Bernhard Mandl and Dominik Kriegner and V{\'a}clav Hol{\'y} and Lars Samuelson and G{\"u}nther Bauer and Knut Deppert and Julian Stangl",
year = "2015",
doi = "10.1107/S160057751402284X",
language = "English",
volume = "22",
pages = "59--66",
journal = "Journal of Synchrotron Radiation",
issn = "1600-5775",
publisher = "International Union of Crystallography",
number = "Pt 1",

}