X-ray photoelectron spectroscopy of low surface concentration mass-selected Ag clusters
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Low surface concentrations of mass-selected clusters deposited under ultra high vacuum conditions on a well-characterized surface were studied with XPS. Analysis of monomers and dimers deposited at low temperature in a thick Xe buffer layer indicates the mobility and aggregation of the clusters in such a film. A stable average cluster size is reached at 53 K that is likely to be the same for all initially deposited cluster sizes studied in the range Ag1-Ag5. Cluster aggregation progresses as the temperature is raised, tending toward the formation of metallic islands at high temperatures.
|Tidskrift||Journal of Chemical Physics|
|Status||Published - 2000 nov 1|
|Peer review utförd||Ja|