Surface Characterization




    The instruments can be used for measurements of the surface properties such as absorption, desorption, interactions, structure and surface tension.

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    Spectroscopic Ellipsometer (Horiba) - sealed fluidic sample chamber

    Ellipsometer (Rudolph Research) - open fluidic sample chamber with stirring

    Multiskop (Optrel) - ellipsometry, imaging, surface plasmons, Brewster angle microscopy

    Quartz Crystal Microbalance (Q-Sense) - adsorption, interactions and mechanical properties in ultra-thin films

    Atomic Force Microscope (Park Systems) - force measurement, topographic imaging, with optional fluidic measurement chamber

    Langmuir Devices (KSV Instruments) - investigate properties of floating monolayers

    Drop and Bubble Shape Tensiometer (Sinterface) – surface tension of liquids, contact angle, dynamic measurement, fast oscillation

    Digitala och fysiska samlingar

    Documentation can be found on the Laboratory Information Management Systems (LIMS) (see links)

    Erbjudna tjänster

    The equipment may be used with the help of a trained operator.

    Ämnesklassifikation (UKÄ)

    • Fysikalisk kemi

    Typ av infrastruktur

    • Utrustning