Ingenjörs- och materialvetenskap
Carrier concentration
13%
Conduction bands
8%
Crystallization
5%
Data storage equipment
18%
Durability
14%
Electric properties
5%
Electrodes
58%
Electrodynamics
6%
Electromagnetic fields
9%
Electron energy loss spectroscopy
8%
Energy efficiency
9%
Ferroelectric films
17%
Ferroelectric materials
100%
Ferroelectricity
72%
Hafnium oxides
22%
Metals
15%
Nanostructures
23%
Nitrogen
11%
Oxide semiconductors
5%
Oxygen
10%
Photonics
5%
Polarization
11%
Remanence
26%
Scalability
10%
Scavenging
17%
Spectroscopy
5%
Sputtering
16%
Surface plasmons
60%
Texturing
48%
Tuning
9%
Tunnel junctions
53%
Fysik och astronomi
annealing
30%
atomic layer epitaxy
13%
breathing
5%
capacitance
20%
capacitance-voltage characteristics
15%
capacitors
10%
characterization
21%
crystallization
9%
cycles
8%
defects
21%
electrical properties
9%
electromagnetic fields
7%
endurance
15%
estimating
33%
evaluation
7%
field effect transistors
29%
hafnium oxides
51%
high resolution
7%
hysteresis
9%
interactions
7%
metal oxide semiconductors
12%
plasmons
31%
polarization
20%
room temperature
7%
shrinkage
12%
students
38%
temperature
22%
thin films
25%
transmission electron microscopy
8%
Kemiska föreningar
Behavior as Electrode
38%
Chemistry
11%
Conduction Band
5%
Dioxygen
9%
Electrodynamics
7%
Electromagnetic Field
12%
Electron Density
8%
Electron Energy Loss Spectroscopy
5%
Energy
8%
Ferroelectric Film
16%
Hafnium Atom
22%
Liquid Film
9%
Nanomaterial
11%
Nitrogen
11%
Optical Spectroscopy
5%
Oxide
10%
Polarization
31%
Pressure
10%
Sputtering
20%
Surface Plasmon
44%
Tunneling
14%
Work Function
5%