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  • Konferenspaper i proceeding

    Hard x-ray nanoprobe of beamline P06 at PETRA III

    Schroer, C. G., Baumbach, C., Döhrmann, R., Klare, S., Hoppe, R., Kahnt, M., Patommel, J., Reinhardt, J., Ritter, S., Samberg, D., Scholz, M., Schropp, A., Seiboth, F., Seyrich, M., Wittwer, F. & Falkenberg, G., 2016 juli 27, Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015. Chubar, O., Jarrige, I., Kaznatcheev, K., Miller, L., Stavitski, E., Tanabe, T., Shaftan, T., Shen, Q., Pindak, R., Nelson, C., Kalbfleisch, S., Thieme, J., Williams, G., Fuchs, M., Rumaiz, A., Wang, J., Evans-Lutterodt, K., Lee, W-K., McSweeney, S. & Vescovo, E. (red.). American Institute of Physics (AIP), Vol. 1741. 030007

    Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceedingPeer review

    14 Citeringar (SciVal)
  • Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity

    Schroer, C. G., Seyrich, M., Schropp, A., Döhrmann, R., Botta, S., Wiljes, P., Brückner, D., Kahnt, M., Wittwer, F., Grote, L., Koziej, D., Garrevoet, J. & Falkenberg, G., 2019 jan. 1, X-Ray Nanoimaging: Instruments and Methods IV. Lai, B. & Somogyi, A. (red.). SPIE, 111120D. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 11112).

    Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceedingPeer review

    7 Citeringar (SciVal)
  • PtyNAMi: Ptychographic nano-analytical microscope at PETRA III - Interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector

    Schroer, C. G., Seyrich, M., Kahnt, M., Botta, S., Döhrmann, R., Falkenberg, G., Garrevoet, J., Lyubomirskiy, M., Scholz, M., Schropp, A. & Wittwer, F., 2017 jan. 1, X-Ray Nanoimaging: Instruments and Methods III. Somogyi, A. & Lai, B. (red.). SPIE, Vol. 10389. 103890E

    Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceedingPeer review

    14 Citeringar (SciVal)
  • Quantitative characterization of aberrations in x-ray optics

    Seiboth, F., Kahnt, M., Scholz, M., Seyrich, M., Wittwer, F., Garrevoet, J., Falkenberg, G., Schropp, A. & Schroer, C. G., 2016 jan. 1, Advances in X-Ray/EUV Optics and Components XI. Morawe, C., Khounsary, A. M. & Goto, S. (red.). SPIE, Vol. 9963. 99630P

    Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceedingPeer review

    10 Citeringar (SciVal)