My research involves the use and the development of advanced characterization techniques, such as scanning probe microscopy (STM, AFM) and X-ray based spectroscopy methods, for investigating nanostructure surfaces and devices, especially semiconductor nanowire heterostructures. I am interested in studying both the atomically resolved surface structure and local surface electronic properties of isolated nanostructures and nanostructure devices during operation. Investigation of quantization effects in nanowire heterostructures will be also be involved.