Hard x-ray nanoprobe of beamline P06 at PETRA III

C. G. Schroer; C. Baumbach; R. Döhrmann; S. Klare; R. Hoppe; M. Kahnt; J. Patommel; J. Reinhardt; S. Ritter; D. Samberg; M. Scholz; A. Schropp; F. Seiboth; M. Seyrich; F. Wittwer; G. Falkenberg

doi:10.1063/1.4952830

Hard x-ray nanoprobe of beamline P06 at PETRA III

C. G. Schroer, C. Baumbach, R. Döhrmann, S. Klare, R. Hoppe, M. Kahnt, J. Patommel, J. Reinhardt, S. Ritter, D. Samberg, M. Scholz, A. Schropp, F. Seiboth, M. Seyrich, F. Wittwer, G. Falkenberg

Forskningsoutput: Kapitel i bok/rapport/Conference proceeding › Konferenspaper i proceeding › Peer review

Sammanfattning

The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly Gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.

Originalspråk	engelska
Titel på värdpublikation	Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
Redaktörer	Oleg Chubar, Ignace Jarrige, Konstantine Kaznatcheev, Lisa Miller, Eli Stavitski, Toshiya Tanabe, Timur Shaftan, Qun Shen, Ronald Pindak, Christie Nelson, Sebastian Kalbfleisch, Juergen Thieme, Garth Williams, Martin Fuchs, Abdul Rumaiz, Jun Wang, Kenneth Evans-Lutterodt, Wah-Keat Lee, Sean McSweeney, Elio Vescovo
Förlag	American Institute of Physics (AIP)
Volym	1741
ISBN (elektroniskt)	9780735413986
DOI	https://doi.org/10.1063/1.4952830
Status	Published - 2016 juli 27
Externt publicerad	Ja
Evenemang	12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015 - New York, USA Varaktighet: 2015 juli 6 → 2015 juli 10

Konferens

Konferens	12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
Land/Territorium	USA
Ort	New York
Period	2015/07/06 → 2015/07/10

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10.1063/1.4952830

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Schroer, C. G., Baumbach, C., Döhrmann, R., Klare, S., Hoppe, R., Kahnt, M., Patommel, J., Reinhardt, J., Ritter, S., Samberg, D., Scholz, M., Schropp, A., Seiboth, F., Seyrich, M., Wittwer, F., & Falkenberg, G. (2016). Hard x-ray nanoprobe of beamline P06 at PETRA III. I O. Chubar, I. Jarrige, K. Kaznatcheev, L. Miller, E. Stavitski, T. Tanabe, T. Shaftan, Q. Shen, R. Pindak, C. Nelson, S. Kalbfleisch, J. Thieme, G. Williams, M. Fuchs, A. Rumaiz, J. Wang, K. Evans-Lutterodt, W.-K. Lee, S. McSweeney, & E. Vescovo (Red.), Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015 (Vol. 1741). Artikel 030007 American Institute of Physics (AIP). https://doi.org/10.1063/1.4952830

Schroer, C. G. ; Baumbach, C. ; Döhrmann, R. et al. / Hard x-ray nanoprobe of beamline P06 at PETRA III. Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015. redaktör / Oleg Chubar ; Ignace Jarrige ; Konstantine Kaznatcheev ; Lisa Miller ; Eli Stavitski ; Toshiya Tanabe ; Timur Shaftan ; Qun Shen ; Ronald Pindak ; Christie Nelson ; Sebastian Kalbfleisch ; Juergen Thieme ; Garth Williams ; Martin Fuchs ; Abdul Rumaiz ; Jun Wang ; Kenneth Evans-Lutterodt ; Wah-Keat Lee ; Sean McSweeney ; Elio Vescovo. Vol. 1741 American Institute of Physics (AIP), 2016.

@inproceedings{a09a465d605f48fbbb3630c5adc7f622,

title = "Hard x-ray nanoprobe of beamline P06 at PETRA III",

abstract = "The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly Gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.",

author = "Schroer, {C. G.} and C. Baumbach and R. D{\"o}hrmann and S. Klare and R. Hoppe and M. Kahnt and J. Patommel and J. Reinhardt and S. Ritter and D. Samberg and M. Scholz and A. Schropp and F. Seiboth and M. Seyrich and F. Wittwer and G. Falkenberg",

year = "2016",

month = jul,

day = "27",

doi = "10.1063/1.4952830",

language = "English",

volume = "1741",

editor = "Oleg Chubar and Ignace Jarrige and Konstantine Kaznatcheev and Lisa Miller and Eli Stavitski and Toshiya Tanabe and Timur Shaftan and Qun Shen and Ronald Pindak and Christie Nelson and Sebastian Kalbfleisch and Juergen Thieme and Garth Williams and Martin Fuchs and Abdul Rumaiz and Jun Wang and Kenneth Evans-Lutterodt and Wah-Keat Lee and Sean McSweeney and Elio Vescovo",

booktitle = "Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015",

publisher = "American Institute of Physics (AIP)",

address = "United States",

note = "12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015 ; Conference date: 06-07-2015 Through 10-07-2015",

}

Schroer, CG, Baumbach, C, Döhrmann, R, Klare, S, Hoppe, R, Kahnt, M, Patommel, J, Reinhardt, J, Ritter, S, Samberg, D, Scholz, M, Schropp, A, Seiboth, F, Seyrich, M, Wittwer, F & Falkenberg, G 2016, Hard x-ray nanoprobe of beamline P06 at PETRA III. i O Chubar, I Jarrige, K Kaznatcheev, L Miller, E Stavitski, T Tanabe, T Shaftan, Q Shen, R Pindak, C Nelson, S Kalbfleisch, J Thieme, G Williams, M Fuchs, A Rumaiz, J Wang, K Evans-Lutterodt, W-K Lee, S McSweeney & E Vescovo (red), Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015. vol. 1741, 030007, American Institute of Physics (AIP), 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015, New York, USA, 2015/07/06. https://doi.org/10.1063/1.4952830

Hard x-ray nanoprobe of beamline P06 at PETRA III. / Schroer, C. G.; Baumbach, C.; Döhrmann, R. et al.
Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015. red. / Oleg Chubar; Ignace Jarrige; Konstantine Kaznatcheev; Lisa Miller; Eli Stavitski; Toshiya Tanabe; Timur Shaftan; Qun Shen; Ronald Pindak; Christie Nelson; Sebastian Kalbfleisch; Juergen Thieme; Garth Williams; Martin Fuchs; Abdul Rumaiz; Jun Wang; Kenneth Evans-Lutterodt; Wah-Keat Lee; Sean McSweeney; Elio Vescovo. Vol. 1741 American Institute of Physics (AIP), 2016. 030007.

Forskningsoutput: Kapitel i bok/rapport/Conference proceeding › Konferenspaper i proceeding › Peer review

TY - GEN

T1 - Hard x-ray nanoprobe of beamline P06 at PETRA III

AU - Schroer, C. G.

AU - Baumbach, C.

AU - Döhrmann, R.

AU - Klare, S.

AU - Hoppe, R.

AU - Kahnt, M.

AU - Patommel, J.

AU - Reinhardt, J.

AU - Ritter, S.

AU - Samberg, D.

AU - Scholz, M.

AU - Schropp, A.

AU - Seiboth, F.

AU - Seyrich, M.

AU - Wittwer, F.

AU - Falkenberg, G.

PY - 2016/7/27

Y1 - 2016/7/27

N2 - The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly Gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.

AB - The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly Gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.

U2 - 10.1063/1.4952830

DO - 10.1063/1.4952830

M3 - Paper in conference proceeding

AN - SCOPUS:84984539161

VL - 1741

BT - Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015

A2 - Chubar, Oleg

A2 - Jarrige, Ignace

A2 - Kaznatcheev, Konstantine

A2 - Miller, Lisa

A2 - Stavitski, Eli

A2 - Tanabe, Toshiya

A2 - Shaftan, Timur

A2 - Shen, Qun

A2 - Pindak, Ronald

A2 - Nelson, Christie

A2 - Kalbfleisch, Sebastian

A2 - Thieme, Juergen

A2 - Williams, Garth

A2 - Fuchs, Martin

A2 - Rumaiz, Abdul

A2 - Wang, Jun

A2 - Evans-Lutterodt, Kenneth

A2 - Lee, Wah-Keat

A2 - McSweeney, Sean

A2 - Vescovo, Elio

PB - American Institute of Physics (AIP)

T2 - 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015

Y2 - 6 July 2015 through 10 July 2015

ER -

Schroer CG, Baumbach C, Döhrmann R, Klare S, Hoppe R, Kahnt M et al. Hard x-ray nanoprobe of beamline P06 at PETRA III. I Chubar O, Jarrige I, Kaznatcheev K, Miller L, Stavitski E, Tanabe T, Shaftan T, Shen Q, Pindak R, Nelson C, Kalbfleisch S, Thieme J, Williams G, Fuchs M, Rumaiz A, Wang J, Evans-Lutterodt K, Lee WK, McSweeney S, Vescovo E, redaktörer, Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015. Vol. 1741. American Institute of Physics (AIP). 2016. 030007 doi: 10.1063/1.4952830

Hard x-ray nanoprobe of beamline P06 at PETRA III

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