Hard x-ray nanoprobe of beamline P06 at PETRA III

C. G. Schroer, C. Baumbach, R. Döhrmann, S. Klare, R. Hoppe, M. Kahnt, J. Patommel, J. Reinhardt, S. Ritter, D. Samberg, M. Scholz, A. Schropp, F. Seiboth, M. Seyrich, F. Wittwer, G. Falkenberg

Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceedingPeer review

14 Citeringar (SciVal)

Sammanfattning

The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly Gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.

Originalspråkengelska
Titel på värdpublikationProceedings of the 12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
RedaktörerOleg Chubar, Ignace Jarrige, Konstantine Kaznatcheev, Lisa Miller, Eli Stavitski, Toshiya Tanabe, Timur Shaftan, Qun Shen, Ronald Pindak, Christie Nelson, Sebastian Kalbfleisch, Juergen Thieme, Garth Williams, Martin Fuchs, Abdul Rumaiz, Jun Wang, Kenneth Evans-Lutterodt, Wah-Keat Lee, Sean McSweeney, Elio Vescovo
FörlagAmerican Institute of Physics (AIP)
Volym1741
ISBN (elektroniskt)9780735413986
DOI
StatusPublished - 2016 juli 27
Externt publiceradJa
Evenemang12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015 - New York, USA
Varaktighet: 2015 juli 62015 juli 10

Konferens

Konferens12th International Conference on Synchrotron Radiation Instrumentation, SRI 2015
Land/TerritoriumUSA
OrtNew York
Period2015/07/062015/07/10

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