Highly-ordered ultrathin films of quaterthiophene on a Ag (111) surface

A. Soukopp; C. Seidel; R. Li; M. Bässler; M. Sokolowski; E. Umbach

doi:10.1016/S0040-6090(95)08338-3

Highly-ordered ultrathin films of quaterthiophene on a Ag (111) surface

A. Soukopp, C. Seidel, R. Li, M. Bässler, M. Sokolowski, E. Umbach

Forskningsoutput: Tidskriftsbidrag › Artikel i vetenskaplig tidskrift › Peer review

Sammanfattning

Ultrathin films of quaterthiophene (4T) were deposited on a Ag(111) surface by vacuum sublimation and characterized with respect to their geometric and electronic properties using several surface-sensitive techniques. For the monolayer (1 ML), a long-range ordered superstructure is found by electron diffraction (LEED). This is commensurate to the Ag(111) surface due to covalent bonding of the "flat-lying" 4T molecule via its π-system. The bonding properties can be deduced from photoelectron spectroscopy results (UPS, XPS). For multilayers (3-20 ML) a gradual decrease of the orientational order is observed by infrared spectroscopy and X-ray absorption.

Originalspråk	engelska
Sidor (från-till)	343-346
Antal sidor	4
Tidskrift	Thin Solid Films
Volym	284-285
DOI	https://doi.org/10.1016/S0040-6090(95)08338-3
Status	Published - 1996 sep. 15
Externt publicerad	Ja

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title = "Highly-ordered ultrathin films of quaterthiophene on a Ag (111) surface",

abstract = "Ultrathin films of quaterthiophene (4T) were deposited on a Ag(111) surface by vacuum sublimation and characterized with respect to their geometric and electronic properties using several surface-sensitive techniques. For the monolayer (1 ML), a long-range ordered superstructure is found by electron diffraction (LEED). This is commensurate to the Ag(111) surface due to covalent bonding of the {"}flat-lying{"} 4T molecule via its π-system. The bonding properties can be deduced from photoelectron spectroscopy results (UPS, XPS). For multilayers (3-20 ML) a gradual decrease of the orientational order is observed by infrared spectroscopy and X-ray absorption.",

keywords = "Commensurate adsorbate layer, Covalent bonding, Epitaxial growth, Surface study",

author = "A. Soukopp and C. Seidel and R. Li and M. B{\"a}ssler and M. Sokolowski and E. Umbach",

year = "1996",

month = sep,

day = "15",

doi = "10.1016/S0040-6090(95)08338-3",

language = "English",

volume = "284-285",

pages = "343--346",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

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TY - JOUR

T1 - Highly-ordered ultrathin films of quaterthiophene on a Ag (111) surface

AU - Soukopp, A.

AU - Seidel, C.

AU - Li, R.

AU - Bässler, M.

AU - Sokolowski, M.

AU - Umbach, E.

PY - 1996/9/15

Y1 - 1996/9/15

N2 - Ultrathin films of quaterthiophene (4T) were deposited on a Ag(111) surface by vacuum sublimation and characterized with respect to their geometric and electronic properties using several surface-sensitive techniques. For the monolayer (1 ML), a long-range ordered superstructure is found by electron diffraction (LEED). This is commensurate to the Ag(111) surface due to covalent bonding of the "flat-lying" 4T molecule via its π-system. The bonding properties can be deduced from photoelectron spectroscopy results (UPS, XPS). For multilayers (3-20 ML) a gradual decrease of the orientational order is observed by infrared spectroscopy and X-ray absorption.

AB - Ultrathin films of quaterthiophene (4T) were deposited on a Ag(111) surface by vacuum sublimation and characterized with respect to their geometric and electronic properties using several surface-sensitive techniques. For the monolayer (1 ML), a long-range ordered superstructure is found by electron diffraction (LEED). This is commensurate to the Ag(111) surface due to covalent bonding of the "flat-lying" 4T molecule via its π-system. The bonding properties can be deduced from photoelectron spectroscopy results (UPS, XPS). For multilayers (3-20 ML) a gradual decrease of the orientational order is observed by infrared spectroscopy and X-ray absorption.

KW - Commensurate adsorbate layer

KW - Covalent bonding

KW - Epitaxial growth

KW - Surface study

UR - https://www.scopus.com/pages/publications/0030233338

U2 - 10.1016/S0040-6090(95)08338-3

DO - 10.1016/S0040-6090(95)08338-3

M3 - Article

AN - SCOPUS:0030233338

SN - 0040-6090

VL - 284-285

SP - 343

EP - 346

JO - Thin Solid Films

JF - Thin Solid Films

ER -

Highly-ordered ultrathin films of quaterthiophene on a Ag (111) surface

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