In situ quantitative analysis of electrochemical oxide film development on metal surfaces using ambient pressure X-ray photoelectron spectroscopy: Industrial alloys

Alfred Larsson, Konstantin Simonov, Josefin Eidhagen, Andrea Grespi, Xiaoqi Yue, Huajie Tang, Anna Delblanc, Mattia Scardamaglia, Andrey Shavorskiy, Jinshan Pan, Edvin Lundgren

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Material Science