Moiré method for nanometer instability investigation of scanning hard x-ray microscopes

Ulrich Vogt, Daniel Köhler, Jannis Dickmann, Jussi Rahomäki, Karolis Parfeniukas, Stefan Kubsky, Filipe Alves, Florent Langlois, Christer Engblom, Tomas Stankevic

MAX IV-laboratoriet

KTH Royal Institute of Technology
Synchrotron SOLEIL

Forskningsoutput: Tidskriftsbidrag › Artikel i vetenskaplig tidskrift › Peer review

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Moiré method for nanometer instability investigation of scanning hard x-ray microscopes

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Physics