Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples

Mikhail Lyubomirskiy, Felix Wittwer, Maik Kahnt, Frieder Koch, Adam Kubec, Ken Vidar Falch, Jan Garrevoet, Martin Seyrich, Christian David, Christian G. Schroer

MAX IV-laboratoriet

German Electron Synchrotron (DESY)
University of Hamburg
Lawrence Berkeley National Laboratory
Paul Scherrer Institute
GSI Helmholtz Centre for Heavy Ion Research
XRnanotech GmbH

Forskningsoutput: Tidskriftsbidrag › Artikel i vetenskaplig tidskrift › Peer review

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Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples

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Physics