Proton Induced X-Ray Emission Applied to Thick Samples

Mats Ahlberg; Roland Akselsson; Gerd Johansson; Thomas B Johansson; Klas Malmqvist

Proton Induced X-Ray Emission Applied to Thick Samples

Mats Ahlberg, Roland Akselsson, Gerd Johansson, Thomas B Johansson, Klas Malmqvist

Forskningsoutput: Konferensbidrag › Konferensabstract › Peer review

71 Nedladdningar (Pure)

Originalspråk	engelska
Status	Published - 1975
Evenemang	The Swedish National Physics Conference - Gothenburg, Sverige Varaktighet: 1975 juni 10 → 1975 juni 12

Konferens

Konferens	The Swedish National Physics Conference
Land/Territorium	Sverige
Ort	Gothenburg
Period	1975/06/10 → 1975/06/12

Bibliografisk information

The information about affiliations in this record was updated in December 2015.
The record was previously connected to the following departments: The International Institute for Industrial Environmental Economics (IIIEE) (011026001), Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007)

Ämnesklassifikation (UKÄ)

Produktionsteknik, arbetsvetenskap och ergonomi
Tvärvetenskapliga studier
Subatomär fysik

Tillgång till dokument

Proton_Induced_X-ray_emission_applied_to_thick_samples

Citera det här

@conference{ecc82857fb614074a7ebb66b46ce0ed0,

title = "Proton Induced X-Ray Emission Applied to Thick Samples",

keywords = "thick samples, particle induced X-ray emission, PIXE",

author = "Mats Ahlberg and Roland Akselsson and Gerd Johansson and Johansson, {Thomas B} and Klas Malmqvist",

note = "The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: The International Institute for Industrial Environmental Economics (IIIEE) (011026001), Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007); The Swedish National Physics Conference ; Conference date: 10-06-1975 Through 12-06-1975",

year = "1975",

language = "English",

}

TY - CONF

T1 - Proton Induced X-Ray Emission Applied to Thick Samples

AU - Ahlberg, Mats

AU - Akselsson, Roland

AU - Johansson, Gerd

AU - Johansson, Thomas B

AU - Malmqvist, Klas

N1 - The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: The International Institute for Industrial Environmental Economics (IIIEE) (011026001), Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007)

PY - 1975

Y1 - 1975

KW - thick samples

KW - particle induced X-ray emission

KW - PIXE

M3 - Abstract

T2 - The Swedish National Physics Conference

Y2 - 10 June 1975 through 12 June 1975

ER -