Proton-Induced X-ray Emission Spectroscopy in Elemental Trace Analysis

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Sammanfattning

Using protons in the MeV range as excitation source and a high resolution Si(Li) detector,X-ray emission spectroscopy is shown to be capable of analyzing many elements with Z > 15 simultaneously at the 10-12 g level. This work discusses a theoretical lower limit of detection at moderate proton energies and gives examples of possible applications: analysis of the elemental composition of air-borne particles as a function of particle size, oil slick identification, and analysis of water and blood serum.
Originalspråkengelska
Sidor (från-till)373-387
TidskriftAdvances in X-Ray Analysis
Volym15
DOI
StatusPublished - 1972

Bibliografisk information

The information about affiliations in this record was updated in December 2015.
The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007), Ergonomics and Aerosol Technology (011025002), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)

Ämnesklassifikation (UKÄ)

  • Produktionsteknik, arbetsvetenskap och ergonomi
  • Subatomär fysik

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