Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: Signal-to-background optimization for imaging with high sensitivity

Christian G. Schroer, Martin Seyrich, Andreas Schropp, Ralph Döhrmann, Stephan Botta, Patrik Wiljes, Dennis Brückner, Maik Kahnt, Felix Wittwer, Lukas Grote, Dorota Koziej, Jan Garrevoet, Gerald Falkenberg

Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceedingPeer review

7 Citeringar (SciVal)

Sammanfattning

The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.

Originalspråkengelska
Titel på värdpublikationX-Ray Nanoimaging
Undertitel på värdpublikationInstruments and Methods IV
RedaktörerBarry Lai, Andrea Somogyi
FörlagSPIE
ISBN (elektroniskt)9781510629172
DOI
StatusPublished - 2019 jan. 1
Externt publiceradJa
EvenemangX-Ray Nanoimaging: Instruments and Methods IV 2019 - San Diego, USA
Varaktighet: 2019 aug. 112019 aug. 12

Publikationsserier

NamnProceedings of SPIE - The International Society for Optical Engineering
Volym11112
ISSN (tryckt)0277-786X
ISSN (elektroniskt)1996-756X

Konferens

KonferensX-Ray Nanoimaging: Instruments and Methods IV 2019
Land/TerritoriumUSA
OrtSan Diego
Period2019/08/112019/08/12

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