TY - JOUR
T1 - Spatially resolved, single-ended two-dimensional visualization of gas flow phenomena using structured illumination
AU - Kristensson, Elias
AU - Richter, Mattias
AU - Pettersson, Sven-Göran
AU - Aldén, Marcus
AU - Andersson-Engels, Stefan
PY - 2008
Y1 - 2008
N2 - A method for 3D mapping of scattering particle concentration in a gaseous medium based on the back-scattered light in a single direction has been demonstrated. The technique is originally developed for microscopy but now implemented on larger-scale samples. The technique used is known as structured illumination, where a sinusoidal grid pattern is projected onto the medium, thus marking the in-focus plane. This makes it possible to discriminate against light originating from the out-of-focus parts of the sample, which usually makes it difficult to detect inner structures of the medium. In this study a flow of nitrogen was introduced into a flow of water droplets, with the aim to optically select only the plane where nitrogen was present. The results indicate that the technique could be used to study, e.g., combustion devices with limited optical access. (C) 2008 Optical Society of America.
AB - A method for 3D mapping of scattering particle concentration in a gaseous medium based on the back-scattered light in a single direction has been demonstrated. The technique is originally developed for microscopy but now implemented on larger-scale samples. The technique used is known as structured illumination, where a sinusoidal grid pattern is projected onto the medium, thus marking the in-focus plane. This makes it possible to discriminate against light originating from the out-of-focus parts of the sample, which usually makes it difficult to detect inner structures of the medium. In this study a flow of nitrogen was introduced into a flow of water droplets, with the aim to optically select only the plane where nitrogen was present. The results indicate that the technique could be used to study, e.g., combustion devices with limited optical access. (C) 2008 Optical Society of America.
U2 - 10.1364/AO.47.003927
DO - 10.1364/AO.47.003927
M3 - Article
SN - 2155-3165
VL - 47
SP - 3927
EP - 3931
JO - Applied Optics
JF - Applied Optics
IS - 21
ER -