Studies on electronical properties of defects in silicon and gallium arsenide

Mats Kleverman

Studies on electronical properties of defects in silicon and gallium arsenide

Mats Kleverman

Fysiska institutionen

Forskningsoutput: Avhandling › Doktorsavhandling (sammanläggning)

Sammanfattning

[abstract missing]

Originalspråk	engelska
Kvalifikation	Doktor
Tilldelande institution	Fysiska institutionen
Handledare	[unknown], [unknown], handledare, Extern person
Tilldelningsdatum	1985 jan. 1
Förlag	Department of Solid State Physics, Lund University, Box 118, S-221 00 Lund, Sweden
Status	Published - 1985

Bibliografisk information

Defence details

Date: 1985-01-01
Time: 10:15
Place: Fysiska Institutionens föreläsningssal

External reviewer(s)

Name: [unknown], [unknown]
Title: [unknown]
Affiliation: [unknown]

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Ämnesklassifikation (UKÄ)

Fysik

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title = "Studies on electronical properties of defects in silicon and gallium arsenide",

abstract = "[abstract missing]",

keywords = "Fysicumarkivet A:1985:Kleverman",

author = "Mats Kleverman",

note = "Defence details Date: 1985-01-01 Time: 10:15 Place: Fysiska Institutionens f{\"o}rel{\"a}sningssal External reviewer(s) Name: [unknown], [unknown] Title: [unknown] Affiliation: [unknown] ---",

year = "1985",

language = "English",

publisher = "Department of Solid State Physics, Lund University, Box 118, S-221 00 Lund, Sweden",

type = "Doctoral Thesis (compilation)",

school = "Department of Physics",

}

TY - THES

T1 - Studies on electronical properties of defects in silicon and gallium arsenide

AU - Kleverman, Mats

N1 - Defence details Date: 1985-01-01 Time: 10:15 Place: Fysiska Institutionens föreläsningssal External reviewer(s) Name: [unknown], [unknown] Title: [unknown] Affiliation: [unknown] ---

PY - 1985

Y1 - 1985

N2 - [abstract missing]

AB - [abstract missing]

KW - Fysicumarkivet A:1985:Kleverman

M3 - Doctoral Thesis (compilation)

PB - Department of Solid State Physics, Lund University, Box 118, S-221 00 Lund, Sweden

ER -

Studies on electronical properties of defects in silicon and gallium arsenide

Sammanfattning

Bibliografisk information

Ämnesklassifikation (UKÄ)

Fingeravtryck

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