Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

Felix Wittwer, Mikhail Lyubomirskiy, Frieder Koch, Maik Kahnt, Martin Seyrich, Jan Garrevoet, Christian David, Christian G. Schroer

Forskningsoutput: Tidskriftsbidrag › Artikel i vetenskaplig tidskrift › Peer review

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Physics