Use of astigmatic re-focusing at HP-XPS end-station

Walan Grizolli, Franz Hennies, Jan Knudsen, Ralf Nyholm, Rami Sankari, Joachim Schnadt

Forskningsoutput: Kapitel i bok/rapport/Conference proceedingKonferenspaper i proceedingPeer review

Sammanfattning

In this paper we present the refocusing optics for the new high pressure photoelectron spectroscopy (HP-XPS) branch line at MAX-lab, based on a plane grating monochromator with vertically collimated beam. For the HP-XPS instrument, the required spot size is dictated by the small geometric acceptance of the HP-XPS electron energy analyzer. Whereas a pair of bendable mirrors in a KB configuration has some advantages as refocusing elements, we have studied whether similar performance can be achieved with a single non-bendable mirror. In this solution, however, the need for strong horizontal magnification results in a strong vertical magnification and into a very asymmetric image, the height being just a fraction of the width. We have studied through an analytical geometrical model and ray tracing simulations the use of astigmatism to increase the vertical beam size up to the geometric acceptance of the detector. As a result the vertical beam size at sample plane is mostly determined by the photon angular distribution and is not dependent on the exit slit aperture size. In addition the vertical beam size can be controlled by the grating c(ff) parameter, making possible to adjust the photon density and minimize sample damage by the radiation.
Originalspråkengelska
Titel på värdpublikation11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012)
FörlagIOP Publishing
Volym425
DOI
StatusPublished - 2013
Evenemang11th International Conference on Synchrotron Radiation Instrumentation (SRI) - Lyon, Frankrike
Varaktighet: 2012 juli 92012 juli 13

Publikationsserier

Namn
Volym425
ISSN (tryckt)1742-6588
ISSN (elektroniskt)1742-6596

Konferens

Konferens11th International Conference on Synchrotron Radiation Instrumentation (SRI)
Land/TerritoriumFrankrike
OrtLyon
Period2012/07/092012/07/13

Ämnesklassifikation (UKÄ)

  • Fysik
  • Atom- och molekylfysik och optik
  • Naturvetenskap

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