X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

Thomas B Johansson; Roland Akselsson; Sven A E Johansson

doi:10.1016/0029-554X(70)90751-2

X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

Thomas B Johansson, Roland Akselsson, Sven A E Johansson

Forskningsoutput: Tidskriftsbidrag › Artikel i vetenskaplig tidskrift › Peer review

Sammanfattning

Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.

Originalspråk	engelska
Sidor (från-till)	141-143
Tidskrift	Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volym	84
Nummer	1
DOI	https://doi.org/10.1016/0029-554X(70)90751-2
Status	Published - 1970

Bibliografisk information

The information about affiliations in this record was updated in December 2015.
The record was previously connected to the following departments: Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)

Ämnesklassifikation (UKÄ)

Subatomär fysik
Produktionsteknik, arbetsvetenskap och ergonomi

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10.1016/0029-554X(70)90751-2

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@article{76d1b721d3f547b797dd4c48466c113d,

title = "X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level",

abstract = "Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.",

keywords = "PIXE, particle induced X-ray emission analysis, trace element analysis",

author = "Johansson, {Thomas B} and Roland Akselsson and Johansson, {Sven A E}",

note = "The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)",

year = "1970",

doi = "10.1016/0029-554X(70)90751-2",

language = "English",

volume = "84",

pages = "141--143",

journal = "Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment",

issn = "0167-5087",

publisher = "Elsevier",

number = "1",

}

X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level. / Johansson, Thomas B ; Akselsson, Roland; Johansson, Sven A E.
I: Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, Vol. 84, Nr. 1, 1970, s. 141-143.

Forskningsoutput: Tidskriftsbidrag › Artikel i vetenskaplig tidskrift › Peer review

TY - JOUR

T1 - X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

AU - Johansson, Thomas B

AU - Akselsson, Roland

AU - Johansson, Sven A E

N1 - The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)

PY - 1970

Y1 - 1970

N2 - Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.

AB - Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.

KW - PIXE

KW - particle induced X-ray emission analysis

KW - trace element analysis

U2 - 10.1016/0029-554X(70)90751-2

DO - 10.1016/0029-554X(70)90751-2

M3 - Article

SN - 0167-5087

VL - 84

SP - 141

EP - 143

JO - Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

JF - Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

IS - 1

ER -

X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level

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